Bayan Lepas, Malaysia

Yuen Tat Lee


Average Co-Inventor Count = 4.3

ph-index = 1

Forward Citations = 5(Granted Patents)


Location History:

  • Petaling Jaya, MY (2008)
  • Bayan Lepas, MY (2018 - 2019)

Company Filing History:


Years Active: 2008-2019

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3 patents (USPTO):Explore Patents

Title: Yuen Tat Lee: Innovator in Test Architecture and Functional Testing

Introduction

Yuen Tat Lee is a prominent inventor based in Bayan Lepas, Malaysia. He has made significant contributions to the field of electronic testing and validation. With a total of 3 patents to his name, Lee has developed innovative solutions that enhance the testing processes for electronic devices.

Latest Patents

One of Yuen Tat Lee's latest patents is focused on a test, validation, and debug architecture. This invention describes an apparatus and method that integrates hardware hooks into silicon parts, allowing for efficient testing and debugging. The architecture includes a controller that provides abstracted access to these hooks, facilitating the collection of test data for validation and debugging purposes. Additionally, it offers tiered secure access and simplifies physical access through a unified test access port.

Another notable patent is the serial I/O functional tester. This apparatus includes a functional test controller that processes communication protocol-specific data. The controller logic combines packet headers with a pseudorandom bit sequence to create packets for testing input/output controllers. This innovation streamlines the functional testing process, ensuring reliable performance of electronic components.

Career Highlights

Yuen Tat Lee is currently employed at Intel Corporation, where he continues to push the boundaries of electronic testing technologies. His work at Intel has allowed him to collaborate with other talented professionals in the field, contributing to advancements in testing methodologies.

Collaborations

Some of Yuen Tat Lee's coworkers include Mark B Trobough and Keshavan K Tiruvallur. Their collaborative efforts have further enhanced the innovative environment at Intel Corporation.

Conclusion

Yuen Tat Lee's contributions to the field of electronic testing through his patents and work at Intel Corporation highlight his role as a key innovator. His inventions are paving the way for more efficient testing and validation processes in the electronics industry.

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