Yue Tang

Title: Innovations of Yue Tang in Defect Analysis

Introduction

Yue Tang is a prominent inventor based in Beijing, China. He has made significant contributions to the field of defect analysis through his innovative methods and systems. With a total of seven patents to his name, his work has had a considerable impact on the industry.

Latest Patents

Yue Tang's latest patents include a computer-implemented method for defect analysis, a computer-implemented method of evaluating the likelihood of defect occurrence, an apparatus for defect analysis, a computer-program product, and an intelligent defect analysis system. The computer-implemented method for defect analysis involves calculating a plurality of weight-of-evidence (WOE) scores for various device operations concerning defects that occurred during a fabrication period. A higher WOE score indicates a stronger correlation between a defect and a device operation. The method ranks these WOE scores to create a list of device operations that are highly correlated with the defects, focusing on those with scores above a specified threshold.

Career Highlights

Throughout his career, Yue Tang has worked with notable companies such as BOE Technology Group Co., Ltd. and Core Wireless Licensing S.a.r.l. His experience in these organizations has allowed him to refine his expertise in defect analysis and contribute to advancements in technology.

Collaborations

Yue Tang has collaborated with talented individuals in his field, including Tian Lan and Haohan Wu. These partnerships have fostered innovation and have been instrumental in the development of his patented technologies.

Conclusion

Yue Tang's contributions to defect analysis through his innovative patents and collaborations highlight his role as a leading inventor in the field. His work continues to influence advancements in technology and improve processes within the industry.