Hangzhou, China

Yue Sun

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Zhejiang Uniview Technologies Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yue Sun. Retrieved from https://idiyas.com/inventor/yue-sun-uzc7ctxb

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Yue Sun: Inventor of a Blind Image Denoising Method.

Introduction

Yue Sun is an inventor associated with Hangzhou, China, and Zhejiang Uniview Technologies Co., Ltd. Sun’s patent work addresses image processing, with a method designed to reduce noise in images without requiring a fixed noise level in advance.

Latest Patents

The provided patent, “Blind Image Denoising Method, Electronic Device, and Storage Medium,” describes a process that uses calibration data from the image acquisition device to determine a target noise parameter. It first applies preliminary filtering, then estimates the image’s noise level using the calibration parameter and filtered image. Finally, it uses that estimate to denoise the original image. The patent record provided lists 1 patent for Yue Sun.

Career Highlights

Sun’s listed invention combines device-specific noise calibration with image-based estimation to guide denoising. The patent also covers implementation through an electronic device and a storage medium, extending the method beyond a standalone image-processing procedure.

Collaborations

The available information associates Yue Sun with Zhejiang Uniview Technologies Co., Ltd. It does not specify additional collaborators or co-inventors for the listed patent.

Conclusion

Yue Sun’s listed patent focuses on a calibrated, adaptive approach to blind image denoising, connecting image acquisition characteristics with noise estimation and final image processing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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