Yue Pan

Title: Innovations of Yue Pan in Antenna Measurement Technology.

Introduction

Yue Pan is a notable inventor based in Xi'an, China. He has made significant contributions to the field of antenna measurement technology. His innovative approach has led to the development of a unique system that enhances the efficiency of antenna attitude measurement.

Latest Patents

Yue Pan holds a patent for an "Antenna attitude fast measurement system and method thereof." This invention includes a data processing unit, a stereo calibration unit, at least two detector measurement units, and multiple target marker units. The target marker units are strategically placed on the back of the antenna main reflector, while the detector measurement units are positioned outside the antenna's circumference. The stereo calibration unit is located directly below the center of the antenna main reflector. This configuration allows for precise measurements, as any two adjacent detector measurement units share a field-of-view intersection area, ensuring that at least one target marker unit is present within this area. The total number of target marker units in all intersection areas is three or more. The data processing unit is electrically connected to the detector measurement units, facilitating efficient data analysis.

Career Highlights

Yue Pan is affiliated with the Xi'an Institute of Optics and Precision Mechanics of CAS. His work at this esteemed institution has allowed him to focus on advancing optical and precision measurement technologies. His dedication to research and innovation has positioned him as a key figure in his field.

Collaborations

Yue Pan collaborates with talented colleagues, including Hu Wang and Shangmin Lin. Their combined expertise fosters a productive research environment, leading to groundbreaking advancements in antenna measurement systems.

Conclusion

Yue Pan's contributions to antenna measurement technology exemplify the spirit of innovation. His patent reflects a significant advancement in the field, showcasing his commitment to enhancing measurement accuracy. The impact of his work will likely influence future developments in antenna technology.