Sunnyvale, CA, United States of America

Yue Lai

This inventor holds 1 USPTO granted patent. Top assignee: Oracle International Corporation. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yue Lai. Retrieved from https://idiyas.com/inventor/yue-lai

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Innovations by Yue Lai

Introduction

Yue Lai is an accomplished inventor based in Sunnyvale, CA. He has made significant contributions to the field of technology, particularly in developing high availability frameworks. His innovative approach has led to the creation of a patent that enhances system reliability and performance.

Latest Patents

Yue Lai holds a patent titled "Method and system for a high availability framework." This patent describes a method for providing a high availability framework that involves executing components within shared and userland environments of different operating systems. The method includes monitoring applications running in these environments to ensure system health and reliability.

Career Highlights

Yue Lai is currently employed at Oracle International Corporation, where he continues to work on cutting-edge technologies. His expertise in high availability systems has positioned him as a valuable asset to his team and the company.

Collaborations

Yue has collaborated with talented individuals such as Pramod Nagaraja Rao and Gia-Khanh Nguyen, who contribute to the innovative projects at Oracle.

Conclusion

Yue Lai's work exemplifies the spirit of innovation in technology. His patent and contributions to high availability frameworks demonstrate his commitment to enhancing system performance and reliability.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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