Yuanwei Zhang

Title: Innovations of Yuanwei Zhang

Introduction

Yuanwei Zhang is a notable inventor based in New Providence, NJ (US). He has made significant contributions to the field of optical imaging, particularly through his innovative patent in phase microscopy. His work exemplifies the intersection of technology and scientific research, showcasing the potential for advancements in imaging systems.

Latest Patents

Yuanwei Zhang holds a patent for "Optically Computed Phase Microscopy." This invention involves optically computed phase imaging systems and methods. An example system includes an interferometer that outputs 3D spatial-spectral data of a sample, which includes an interferometric signal. The optical computation assembly features a spatial light modulator that modulates the 3D spatial-spectral data with a modulation pattern. This modulation pattern selects a depth to obtain a sample signal and facilitates phase extraction through waveform creation. The system also includes a detector for capturing 2D spatial data and a processor that extracts phase information from the sample.

Career Highlights

Yuanwei Zhang is affiliated with the New Jersey Institute of Technology, where he continues to advance his research and development in optical technologies. His work has garnered attention for its innovative approach to phase imaging, which has applications in various scientific fields.

Collaborations

Yuanwei collaborates with talented individuals such as Xuan Liu and Yuwei Liu. Their combined expertise contributes to the advancement of research and innovation in their respective fields.

Conclusion

Yuanwei Zhang's contributions to optical imaging through his patent on optically computed phase microscopy highlight his role as a significant inventor in the field. His work not only enhances imaging technology but also paves the way for future innovations.