The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2025
Filed:
Nov. 09, 2022
New Jersey Institute of Technology, Newawrk, NJ (US);
Xuan Liu, Berkeley Heights, NJ (US);
Yuwei Liu, Harrison, NJ (US);
Yuanwei Zhang, New Providence, NJ (US);
Zhaoxiong Wan, Newark, NJ (US);
New Jersey Institute of Technology, Newark, NJ (US);
Abstract
Optically computed phase imaging systems and methods are provided. An example system includes an interferometer configured to output 3D spatial-spectral data of a sample including an interferometric signal and an optical computation assembly having a spatial light modulator configured to modulate the 3D spatial-spectral data with a modulation pattern. The modulation pattern modulates the interferometric signal along a spectral dimension to select a depth to obtain a sample signal at the selected depth and modulates the interferometric signal along a first spatial dimension to create a waveform to facilitate phase extraction. The system further includes a detector configured to detect 2D spatial data of the sample. The system further includes a processor coupled to a memory, the processor configured to process the 2D spatial data to extract phase information of the sample.