Anhui, China

Yuanhang Wang

This inventor holds 1 USPTO granted patent. Top assignee: Hefei University of Technology. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yuanhang Wang. Retrieved from https://idiyas.com/inventor/yuanhang-wang-zy8gd7qy

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2024

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Innovations of Yuanhang Wang in Deep Learning for Fault Diagnosis

Introduction

Yuanhang Wang is an accomplished inventor based in Anhui, China. He has made significant contributions to the field of deep learning, particularly in the area of fault diagnosis. His innovative approach integrates prior knowledge to enhance the accuracy and efficiency of diagnosing faults in various systems.

Latest Patents

Yuanhang Wang holds a patent for a deep learning method that integrates prior knowledge for fault diagnosis. This method involves processing a fault diagnosis data set using sliding window techniques to create a picture-like sample data set. The process includes obtaining an attention matrix and constructing a 2D-CNN model to generate a feature map. The model utilizes channel-oriented average and maximum pooling to produce outputs based on an attention mechanism, resulting in a refined feature map.

Career Highlights

Yuanhang Wang is affiliated with Hefei University of Technology, where he continues to advance his research in deep learning and fault diagnosis. His work has garnered attention for its innovative methodologies and practical applications in various industries.

Collaborations

Yuanhang Wang collaborates with notable colleagues, including Qiang Zhang and Ting Huang. Their combined expertise contributes to the development of cutting-edge technologies in their field.

Conclusion

Yuanhang Wang's contributions to deep learning and fault diagnosis exemplify the impact of innovative thinking in technology. His patent reflects a significant advancement in the field, showcasing the potential of integrating prior knowledge into machine learning models.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…