Taoyuan, Taiwan

Yu Te Hsieh

This inventor holds 1 USPTO granted patent. Top assignee: Aptina Imaging Corporation. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yu Te Hsieh. Retrieved from https://idiyas.com/inventor/yu-te-hsieh-x2ldg4sh

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: The Innovations of Yu Te Hsieh

Introduction

Yu Te Hsieh is a prominent inventor based in Taoyuan, Taiwan. She has made significant contributions to the field of sensor technology. Her innovative work has led to the development of a unique patent that enhances the functionality of stacked chip packages.

Latest Patents

Yu Te Hsieh holds a patent for a "Stacked Sensor Packaging Structure and Method." This patent discloses a stacked chip package that includes an image sensor with a recess formed on its surface. Additionally, it features a digital signal processor chip positioned within this recess. The method of fabricating this stacked chip package involves forming a recess on the surface of the image sensor and positioning the digital signal processor in that recess.

Career Highlights

Yu Te Hsieh is currently employed at Aptina Imaging Corporation, where she continues to push the boundaries of imaging technology. Her work at the company has been instrumental in advancing sensor packaging solutions.

Collaborations

Yu Te Hsieh has collaborated with notable professionals in her field, including her coworker Larry Duane Kinsman. Their combined expertise has contributed to the success of various projects within the company.

Conclusion

Yu Te Hsieh's innovative contributions to sensor technology and her patent for a stacked sensor packaging structure exemplify her dedication to advancing the field. Her work continues to influence the development of imaging solutions in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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