Company Filing History:
Years Active: 2023-2025
Title: Yu-Shiuan Li: Innovator in 3D Sensor Technology
Introduction
Yu-Shiuan Li is a prominent inventor based in Hsinchu County, Taiwan. He has made significant contributions to the field of 3D sensor technology, holding three patents that enhance measurement accuracy and image processing capabilities.
Latest Patents
One of his latest patents is titled "System and method for improving 3D sensor measurement accuracy." This invention provides systems and methods that improve the accuracy of three-dimensional sensor measurements. The apparatus includes a distance-estimation system, a distance-refinement system, and a processing system. The distance-estimation system determines the first distance between two points in an environment using a first optical signal. The distance-refinement system then uses a second optical signal to determine a second distance. The processing system combines this information to calculate a third distance, which is more accurate than the first distance.
Another notable patent is "High resolution 3D image processing apparatus and method thereof." This invention features an image processing apparatus that includes an image sensor with multiple photodetectors and a 3D image calculating module. The image sensor generates input information at different times and locations, which is processed to produce high-quality 3D images. At least one of the photodetectors in this system is made of germanium, enhancing its performance.
Career Highlights
Yu-Shiuan Li is currently employed at Artilux Corporation, where he continues to innovate in the field of 3D imaging and sensor technology. His work has positioned him as a key figure in advancing the capabilities of optical systems.
Collaborations
He collaborates with talented individuals such as Yun-chung Na and Shu-Lu Chen, contributing to the development of cutting-edge technologies in their field.
Conclusion
Yu-Shiuan Li's contributions to 3D sensor technology and image processing have made a significant impact in the industry. His innovative patents reflect his commitment to enhancing measurement accuracy and image quality.