This inventor holds 1 USPTO granted patent. Top assignee: United Semiconductor (Xiamen) Co., Ltd.. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Yu Peng Hong: Innovator in Wafer Defect Detection
Introduction
Yu Peng Hong is a notable inventor based in Shamen City, China. He has made significant contributions to the field of semiconductor technology, particularly in the detection of defects on wafers. His innovative approach has led to advancements that benefit the industry.
Latest Patents
Yu Peng Hong holds a patent titled "Method for Detecting Defects on Wafers, System for Detecting Defects on Wafers." This patent showcases his expertise in developing systems that enhance the quality control processes in semiconductor manufacturing. He has 1 patent to his name, reflecting his commitment to innovation.
Career Highlights
He is currently employed at United Semiconductor (Xiamen) Co., Ltd., where he continues to work on cutting-edge technologies. His role at the company allows him to apply his knowledge and skills in a practical setting, contributing to the advancement of semiconductor technology.
Collaborations
Yu Peng Hong collaborates with talented coworkers, including Wen Yi Tan and Chin-Chun Huang. These partnerships foster a creative environment that encourages the exchange of ideas and enhances the development of innovative solutions.
Conclusion
In summary, Yu Peng Hong is a dedicated inventor whose work in wafer defect detection has made a significant impact in the semiconductor industry. His contributions and collaborations continue to drive innovation forward.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile