Hwaseong, South Korea

Yu Min Cho

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Hyundai Mobis Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yu Min Cho. Retrieved from https://idiyas.com/inventor/yu-min-cho-0bnqsohv

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Yu Min Cho - Innovator in Defect Detection Technology

Introduction

Yu Min Cho is a notable inventor based in Hwaseong, South Korea. He has made significant contributions to the field of defect detection technology. His innovative approach has led to the development of a unique method and apparatus that enhances the accuracy of defect detection in products.

Latest Patents

Yu Min Cho holds a patent for a "Method and apparatus for detecting defect based on phased pass/fail determination." This patent describes a method that includes acquiring a product image, performing a pass/fail determination using a first model, and utilizing a second model for further determination when the first model is inconclusive. This innovative approach aims to improve the reliability of defect detection processes.

Career Highlights

Yu Min Cho is currently employed at Hyundai Mobis Corporation, where he applies his expertise in developing advanced technologies. His work focuses on enhancing product quality through innovative detection methods. His contributions have been instrumental in advancing the company's technological capabilities.

Collaborations

Yu Min Cho collaborates with talented colleagues, including Tae Hyun Kim and Kyu Ha Song. Together, they work on various projects that aim to push the boundaries of technology in their field.

Conclusion

Yu Min Cho's innovative work in defect detection technology exemplifies the impact of dedicated inventors in advancing industrial processes. His contributions continue to shape the future of product quality assurance.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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