This inventor holds 1 USPTO granted patent. Top assignee: National Tsing Hua University. Active years: 2018.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2018
Title: Innovations of Yu-Liang Yeh in Stress Measurement Technology.
Introduction
Yu-Liang Yeh is a prominent inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of optical materials through his innovative patent. His work focuses on developing methods to measure stress in optical materials, which is crucial for various applications in engineering and materials science.
Latest Patents
Yu-Liang Yeh holds a patent for a "Stress measurement method and system for optical materials." This patent describes a comprehensive stress measurement method that includes an image capturing procedure, a phase shift calculation procedure, an isochromatic intensifying procedure, and a transformation procedure. The method captures four light intensity images at different phase angles and calculates the isochromatic retardation of the sample. This innovative approach allows for accurate stress measurement, particularly in low-stress conditions.
Career Highlights
Yu-Liang Yeh is affiliated with National Tsing Hua University, where he continues to advance research in optical materials. His work has garnered attention for its practical applications and contributions to the scientific community. With a focus on precision and innovation, he has established himself as a key figure in his field.
Collaborations
Yu-Liang Yeh collaborates with notable colleagues, including Wei-Chung Wang and Po-Yu Chen. Their combined expertise enhances the research and development of stress measurement technologies.
Conclusion
Yu-Liang Yeh's contributions to stress measurement methods for optical materials exemplify the importance of innovation in scientific research. His work not only advances the field but also provides valuable tools for various applications.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile