Yu-Jie Lan

Title: Innovations of Yu-Jie Lan in X-ray Imaging Technology.

Introduction

Yu-Jie Lan is a notable inventor based in Kaohsiung, Taiwan. He has made significant contributions to the field of X-ray imaging technology. His innovative approach has led to the development of a unique test phantom that enhances the accuracy and efficiency of X-ray imaging.

Latest Patents

Yu-Jie Lan holds a patent for a "Test phantom for X-ray imaging." This invention provides a test phantom that comprises a prosthetic fin and an edge patch. The prosthetic fin features a plurality of different arithmetical series sizes of circular grooves and various thicknesses of line pairs. The edge patch connects to one side of the prosthetic fin. This invention also includes a test phantom combination for X-ray imaging and a method for measuring parameters and focal spots.

Career Highlights

Yu-Jie Lan is affiliated with National Yang Ming Chiao Tung University, where he continues to advance research in imaging technologies. His work is recognized for its practical applications in medical imaging, contributing to improved diagnostic capabilities.

Collaborations

He has collaborated with notable colleagues, including Suei-Ting Jhao and Jyh-Cheng Chen. Their combined expertise enhances the research and development efforts in their field.

Conclusion

Yu-Jie Lan's contributions to X-ray imaging technology exemplify the impact of innovative thinking in medical diagnostics. His patent reflects a commitment to improving imaging techniques, which can lead to better patient outcomes.