The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2020
Filed:
Jan. 04, 2018
Applicant:
National Yang Ming University, Taipei, TW;
Inventors:
Suei-Ting Jhao, Taipei, TW;
Jyh-Cheng Chen, Taipei, TW;
Wei-Hung Shih, Kaohsiung, TW;
Yu-Jie Lan, Kaohsiung, TW;
Assignee:
National Yang-Ming University, Taipei, TW;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/583 (2013.01); A61B 6/44 (2013.01);
Abstract
The present invention provides a test phantom for X-ray imaging, which comprises a prosthetic fin and an edge patch; wherein the prosthetic fin has a plurality of different arithmetical series sizes of circular grooves and plurality of different arithmetical series thickness of the line pairs; wherein the edge patch connects on one side of the prosthetic fin. The present invention further provides a test phantom combination for X-ray imaging and a method for measuring parameters and focal spot.