Echizen, Japan

Yu Ishihara

This inventor holds 1 USPTO granted patent. Top assignee: Shin-Etsu Quartz Products Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yu Ishihara. Retrieved from https://idiyas.com/inventor/yu-ishihara-qqozl0zq

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Yu Ishihara and Quartz Glass Crucible Evaluation

Introduction

Yu Ishihara is an inventor associated with Echizen, Japan, and Shin-Etsu Quartz Products Ltd. His patent work addresses the evaluation and manufacture of quartz glass crucibles, which are used in demanding industrial processes.

Latest Patents

Ishihara is named on 1 patent: “Method for Evaluating Quartz Glass Crucible, Method for Manufacturing the Same, and Quartz Glass Crucible.” The invention describes a nondestructive method for assessing oxygen-deficiency defects in a crucible with an opaque, bubble-containing outer layer and a transparent inner layer. The method irradiates the crucible with ultraviolet light and detects whether blue fluorescence is emitted. The presence or absence of that fluorescence is used to evaluate the defects. The patent also describes using hydrogen doping and water-vapor introduction to support this evaluation.

Career Highlights

Ishihara’s documented patent contribution focuses on practical assessment of quartz glass crucibles. The approach is designed to make defect evaluation easier without damaging the crucible.

Collaborations

Ishihara’s patent lists Yuji Baba as a coworker. The invention is associated with Shin-Etsu Quartz Products Ltd.

Conclusion

Yu Ishihara’s patent work contributes a fluorescence-based method for evaluating oxygen-deficiency defects in quartz glass crucibles, supporting nondestructive inspection and manufacturing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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