San Diego, CA, United States of America

Yu Hai

This inventor holds 1 USPTO granted patent. Top assignee: Here Global B.v.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yu Hai. Retrieved from https://idiyas.com/inventor/yu-hai-ac669xwm

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Yu Hai and Road-Feature Detection Using Artificial Shadow Data.

Introduction

Yu Hai is an inventor based in San Diego, California. His patent work addresses a challenge in computer vision: helping machine-learning systems detect road features in image data, including when shadows affect how those features appear.

Latest Patents

The available information identifies one patent associated with Yu Hai: “System and Method for Detection of Road Features Based on Artificial Shadow Data.” The disclosed approach determines shadowed regions in images and uses them to generate artificial shadow data. It then augments image data with those artificial shadows and trains a machine-learning model using the augmented images and corresponding ground-truth labels. The model is trained to detect road features.

Career Highlights

Yu Hai is associated with Here Global B.V., a company working in location and mapping technologies. His listed patent reflects an application of machine learning to road-image analysis. The available information does not provide further details about his role or career history. The record lists 1 patent.

Collaborations

Xiaoying Jin is listed as Yu Hai’s coworker. The available information does not specify whether they collaborated on the patent or describe their respective contributions.

Conclusion

Yu Hai’s listed patent presents a method for improving road-feature detection by training a machine-learning model with image data augmented using artificial shadows.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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