Tokyo, Japan

Yozo Sawada

This inventor holds 2 USPTO granted patents. Top assignee: Nec Corporation. Active years: 1994.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yozo Sawada. Retrieved from https://idiyas.com/inventor/yozo-sawada

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 1994

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2 patents (USPTO):Explore Patents

Title: Yozo Sawada: Innovator in Magnetic Tape Storage Technology

Introduction

Yozo Sawada is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of electronic computing, particularly in magnetic tape storage technology. With a total of 2 patents to his name, Sawada's work has had a lasting impact on data storage solutions.

Latest Patents

Among his latest innovations is the magnetic tape storage unit designed specifically for electronic computers. This invention showcases his expertise in developing efficient and reliable data storage systems that cater to the needs of modern computing.

Career Highlights

Sawada is currently employed at NEC Corporation, a leading technology company known for its advancements in information technology and electronics. His role at NEC has allowed him to further his research and development efforts in the field of magnetic storage.

Collaborations

Throughout his career, Sawada has collaborated with various professionals in the industry, including his coworker Kimio Nobeashi. These collaborations have fostered an environment of innovation and creativity, leading to the development of cutting-edge technologies.

Conclusion

Yozo Sawada's contributions to magnetic tape storage technology exemplify his dedication to innovation in the field of electronic computing. His work continues to influence the way data is stored and accessed in modern technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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