Taichung, Taiwan

Yow-Wen Hsieh

This inventor holds 1 USPTO granted patent. Top assignee: China Medical University. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yow-Wen Hsieh. Retrieved from https://idiyas.com/inventor/yow-wen-hsieh

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: Yow-Wen Hsieh: Innovator in Graphical User Interface Technology

Introduction

Yow-Wen Hsieh is a notable inventor based in Taichung, Taiwan. He has made significant contributions to the field of graphical user interfaces, showcasing his innovative spirit through his patent work. His dedication to advancing technology is evident in his professional endeavors.

Latest Patents

Yow-Wen Hsieh holds a patent for a "Display screen or portion thereof with graphical user interface." This invention reflects his commitment to enhancing user experience through improved interface design. He has 1 patent to his name, highlighting his contributions to the field.

Career Highlights

Hsieh is affiliated with China Medical University, where he applies his expertise in technology to support medical advancements. His role at the university allows him to bridge the gap between technology and healthcare, fostering innovation in both sectors.

Collaborations

Throughout his career, Yow-Wen Hsieh has collaborated with esteemed colleagues, including Der-Yang Cho and Chih-Yu Chi. These partnerships have enabled him to expand his research and contribute to various projects in the field of technology.

Conclusion

Yow-Wen Hsieh is a distinguished inventor whose work in graphical user interfaces has made a lasting impact. His patent and collaborations reflect his dedication to innovation and technology advancement.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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