Suwon, South Korea

Younsu Ha

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Samsung Electronics Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Younsu Ha. Retrieved from https://idiyas.com/inventor/younsu-ha

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Younsu Ha: Image Sensor Innovation

Introduction

Younsu Ha is an inventor based in Suwon, South Korea, and is associated with Samsung Electronics Co., Ltd. His recorded patent concerns image sensor design and fabrication.

Latest Patents

Ha’s listed patent, “Image Sensor and Method of Fabricating the Same,” describes an image sensor with a substrate divided into a pixel area and an optically black area. Color filters are positioned over the pixel area, while an optically black pattern is formed in a recess over the optically black area. The pattern uses the same material as one of the color filters, and its top surface is level with the color filters. This design integrates the optically black pattern with the sensor’s color-filter structure. Ha is credited with 1 patent in the information provided.

Career Highlights

The available information identifies Ha’s work in image sensor technology and his association with Samsung Electronics Co., Ltd. His patent focuses on both the sensor structure and a method for fabricating it.

Collaborations

The provided information connects Ha’s patent work with Samsung Electronics Co., Ltd. It does not specify individual co-inventors or other collaborators.

Conclusion

Younsu Ha’s recorded invention addresses the integration of an optically black pattern and color filters in an image sensor, reflecting a focused contribution to sensor design and fabrication.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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