Gyeonggi-do, South Korea

Youngsik Park

This inventor holds 2 USPTO granted patents and 1 published patent application. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2019-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Youngsik Park. Retrieved from https://idiyas.com/inventor/youngsik-park

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 2 

% Patents Active = 100.0

Average Co-Inventor Count = 5.3

ph-index = 1


Company Filing History:


Years Active: 2019-2026

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2 patents (USPTO):Explore Patents

Title: Youngsik Park - Innovator in Semiconductor Technology

Introduction

Youngsik Park is an inventor based in Suwon-si, South Korea. He has made contributions to the field of semiconductor technology, focusing on innovative designs that enhance device performance. Although he currently holds no granted patents, his work is significant in the realm of semiconductor devices.

Latest Patent Applications

Youngsik Park's latest patent application is titled "SEMICONDUCTOR DEVICE HAVING TEST PATTERN." This application describes a semiconductor device that includes a semiconductor substrate, a first test pattern disposed on the semiconductor substrate, and a second test pattern located adjacent to the first test pattern. The first test pattern includes an overlay pattern, while the second test pattern comprises a test element group. This innovative approach aims to improve testing and performance evaluation in semiconductor devices.

Conclusion

Youngsik Park is an emerging inventor in the semiconductor field, with a focus on enhancing device testing through innovative designs. His contributions, although not yet recognized through granted patents, reflect a commitment to advancing technology in this critical area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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