Daejeon, South Korea

Youngseok Jung

This inventor holds 1 USPTO granted patent. Top assignee: Korea Institute of Energy Research. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Youngseok Jung. Retrieved from https://idiyas.com/inventor/youngseok-jung-omcn71sa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Youngseok Jung and Photovoltaic System Fault Diagnosis

Introduction

Youngseok Jung is an inventor based in Daejeon, South Korea. His work includes a patented approach to diagnosing faults in photovoltaic systems.

Latest Patents

Jung is associated with 1 patent: “Photovoltaic System Having Fault Diagnosis Apparatus, and Fault Diagnosis Method for Photovoltaic System.” The invention uses temperature sensors to measure the junction box’s internal temperature and the solar module’s surface temperature, along with a voltage sensor in the junction box. An operation unit compares these measurements to identify whether a fault is in the solar module, inside the junction box, or in the inverter. The approach is designed to keep initial investment costs low and detect solar module faults that may be difficult to spot by visual inspection.

Career Highlights

Jung is associated with the Korea Institute of Energy Research. His patent reflects work on practical fault detection for photovoltaic systems.

Collaborations

The provided information names Gi-hwan Kang and Hee-eun Song as Jung’s coworkers. Their specific roles in the patent or related work are not specified.

Conclusion

Youngseok Jung’s photovoltaic fault-diagnosis invention combines temperature and voltage measurements to help locate system faults affordably and detect issues that may not be visible to the naked eye.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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