Suwon, South Korea

Youngchun Ahn

This inventor holds 4 USPTO granted patents and 1 published patent application. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2022-2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Youngchun Ahn. Retrieved from https://idiyas.com/inventor/youngchun-ahn

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 4 

% Patents Active = 100.0

Average Co-Inventor Count = 1.2

ph-index = 1


Company Filing History:


Years Active: 2022-2025

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4 patents (USPTO):Explore Patents

Title: Youngchun Ahn: Inventor in Image Processing and Detection.

Introduction

Youngchun Ahn is an inventor based in Suwon, South Korea. He works at Samsung Electronics Co., Ltd., and his patent portfolio includes 4 patents.

Latest Patents

Ahn’s recent patent work includes technologies for image quality processing and image detection.

“Computing Device for Instance-Based Image Quality Processing and Operating Method Therefor” describes a system that uses neural networks to identify instances within an image, estimate a quality score for each instance, and apply image quality processing separately to each one.

“Image Detection Apparatus and Operation Method Thereof” describes a system that detects areas containing additional information in displayed images. It learns the style of such areas in one image and uses that information to identify areas with a different style in another image.

Career Highlights

At Samsung Electronics, Ahn’s disclosed inventions address neural-network-based image analysis and processing. His work includes methods for adapting image enhancement to individual instances and detecting changes in the appearance of additional-information areas.

Collaborations

Ahn’s listed coworkers include Hyeseon Heo and Kyoungjae Park.

Conclusion

Youngchun Ahn’s patent work at Samsung Electronics focuses on image processing and detection, including instance-specific quality adjustment and neural-network-based identification of image areas.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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