This inventor holds 1 USPTO granted patent. Top assignee: Korea Research Institute of Standards and Science. Active years: 2022.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2022
Title: Young-Sik Ghim: Innovator in 3D Shape Measurement Technology
Introduction
Young-Sik Ghim is a prominent inventor based in Sejong-si, South Korea. He has made significant contributions to the field of 3D shape measurement technology. His innovative work focuses on high-speed deflectometry, which has applications in various industries.
Latest Patents
Young-Sik Ghim holds a patent for a "System and method for 3D shape measurement of freeform surface based on high-speed deflectometry using composite patterns." This patent describes a system that includes a composite pattern generation part, a detector for acquiring images, and a phase acquisition part to process the data. The technology aims to enhance the accuracy and efficiency of measuring complex surfaces.
Career Highlights
Ghim is affiliated with the Korea Research Institute of Standards and Science, where he continues to advance his research and development efforts. His work has garnered attention for its potential to improve measurement techniques in various scientific and industrial applications.
Collaborations
He has collaborated with notable colleagues, including The Manh Nguyen and Hyug-gyo Rhee, contributing to the advancement of their shared research goals.
Conclusion
Young-Sik Ghim's innovative contributions to 3D shape measurement technology exemplify the impact of dedicated research and collaboration in advancing scientific knowledge. His work continues to influence the field and inspire future innovations.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile