This inventor holds 1 USPTO granted patent. Top assignee: Institute for Basic Science. Active years: 2018.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2018
Title: Young-Kwon Kim: Innovator in High-Vacuum Measurement Systems
Introduction
Young-Kwon Kim is a prominent inventor based in Daejeon, South Korea. He has made significant contributions to the field of measurement systems, particularly in high-vacuum environments. His innovative approach has led to the development of a unique system that enhances precision in scientific measurements.
Latest Patents
Young-Kwon Kim holds a patent for a "System for measuring displacement of accelerating tube in high-vacuum chamber by using micro-alignment telescope and method thereof." This system includes a vacuum chamber, a hollow accelerating tube, and a micro-alignment telescope, which work together to accurately measure displacement. The design features a sighting target attached to the accelerating tube and lens devices that ensure alignment along a single axis, facilitating precise measurements in challenging conditions.
Career Highlights
Young-Kwon Kim is affiliated with the Institute for Basic Science, where he continues to push the boundaries of measurement technology. His work is characterized by a commitment to advancing scientific research through innovative solutions. With a focus on high-vacuum applications, he has established himself as a key figure in his field.
Collaborations
Throughout his career, Young-Kwon Kim has collaborated with notable colleagues, including Woo-Kang Kim and Yong-Woo Jo. These partnerships have fostered a collaborative environment that encourages the exchange of ideas and expertise, further enhancing the impact of their work.
Conclusion
Young-Kwon Kim's contributions to the field of high-vacuum measurement systems exemplify the spirit of innovation. His patented technology not only advances scientific understanding but also sets a standard for future developments in measurement techniques.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
