Newark, CA, United States of America

Young Hyun Kwon

This inventor holds 3 USPTO granted patents and 4 published patent applications. Top assignee: Badge Inc.. Active years: 2025-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Young Hyun Kwon. Retrieved from https://idiyas.com/inventor/young-hyun-kwon

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 3 

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2025-2026

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3 patents (USPTO):Explore Patents

Title: Young Hyun Kwon: Innovator in Biometric Authentication

Introduction

Young Hyun Kwon is a notable inventor based in Newark, CA (US). He has made significant contributions to the field of biometric authentication, particularly through his innovative methods that enhance privacy and security.

Latest Patents

Kwon holds a patent for "Privacy-preserving biometric authentication using asymmetrically loaded servers." This method utilizes biometric data to authenticate individuals whose data has been previously obtained. The process involves a series of computer operations with asymmetrically loaded servers configured with one-time values for multi-party computing, ensuring secure authentication.

Career Highlights

Young Hyun Kwon is currently associated with Badge Inc., where he applies his expertise in biometric technologies. His work focuses on developing advanced solutions that address privacy concerns in biometric authentication.

Collaborations

Kwon collaborates with talented professionals such as Charles H Herder and Tina P Srivastava, contributing to innovative projects within his field.

Conclusion

Young Hyun Kwon's work in biometric authentication exemplifies the intersection of technology and privacy. His contributions are paving the way for more secure and efficient authentication methods in the digital age.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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