Hwaseong, South Korea

Young-Hee Jung

This inventor holds 2 USPTO granted patents and 1 published patent application. Active years: 2023-2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Young-Hee Jung. Retrieved from https://idiyas.com/inventor/young-hee-jung-ez94rx7b

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 2 

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Years Active: 2023-2025

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2 patents (USPTO):Explore Patents

Title: Young-Hee Jung: DRAM and Memory-Termination Patents.

Introduction

Young-Hee Jung is a woman inventor associated with Hwaseong, South Korea. The information provided lists 2 patents in her portfolio, including work on DRAM devices and on-die termination (ODT) resistor adjustment.

Latest Patents

Jung’s latest listed patent is titled “DRAM Device and ODT Resistor Value Adjustment Method and Computer Program for the Same.” The invention describes a DRAM device with at least one DRAM module and a memory controller. The controller measures the resistance of an ODT resistor associated with a rank, chipset, or DQ, then uses that measurement to set the resistance value for the corresponding component. The disclosure also covers a method for setting ODT resistance and a computer program for carrying it out.

Career Highlights

The available information highlights Jung’s patent work in memory-system design, particularly techniques for measuring and adjusting ODT resistance in DRAM. These techniques address resistance settings at different levels of a memory system, including ranks, chipsets, and DQs.

Collaborations

Sang-Seok Kang and Sun-Young Lee are identified as Jung’s coworkers. The information provided does not specify their roles in the listed patent.

Conclusion

Young-Hee Jung’s listed patent work focuses on DRAM and ODT resistance adjustment, reflecting an inventive contribution to memory-device configuration and control.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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