This inventor holds 1 USPTO granted patent. Top assignee: Sam Jung Co., Ltd.. Active years: 1998.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1998
Title: Young-Bin Cho: Innovator in Perpendicularity Measurement
Introduction
Young-Bin Cho is a notable inventor based in Seo-Gu, South Korea. He has made significant contributions to the field of measurement technology, particularly with his innovative approach to measuring perpendicularity. His work is characterized by a blend of optical principles and advanced data processing techniques.
Latest Patents
Young-Bin Cho holds a patent for a "Perpendicularity measuring method and an apparatus thereof." This invention presents a non-contacting method for measuring the perpendicularity of a straight post installed perpendicularly to a reference plane. The method involves capturing partial images of both the upper and lower ends of the post from two perpendicular directions. These images are then combined to calculate the inclinations or deviations of the post's ends, allowing for accurate measurement of perpendicularity without direct contact. This innovative approach addresses the common issue of measurement errors caused by contact, making it particularly useful for objects in confined spaces.
Career Highlights
Young-Bin Cho is currently employed at Sam Jung Co., Ltd., where he continues to develop and refine his measurement technologies. His work has garnered attention for its practical applications and effectiveness in various industrial settings.
Collaborations
He collaborates with talented coworkers, including Dae-Gab Gweon and Hee Hyeong Moon, who contribute to the development and implementation of his innovative measurement solutions.
Conclusion
Young-Bin Cho's contributions to measurement technology, particularly through his patented method for measuring perpendicularity, highlight his role as an influential inventor in the field. His work not only enhances measurement accuracy but also simplifies the process for various applications.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile