This inventor holds 1 USPTO granted patent. Top assignee: Chinese Academy of Sciences. Active years: 2025.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2025
Title: Youlong Ke: Innovator in Hyperspectral Imaging Technology
Introduction
Youlong Ke is a prominent inventor based in Shanghai, China. He has made significant contributions to the field of hyperspectral imaging technology. His innovative work focuses on enhancing the capabilities of solar reflection detection systems.
Latest Patents
Youlong Ke holds a patent for a "Solar reflection full-band hyperspectral imaging detection system." This advanced system includes a telescope light collection system, a field-of-view separation assembly, a spectrometer assembly, and a detector assembly. The field-of-view separation assembly features an integrated trisection field-of-view separator along with three distinct field-of-view assemblies. The spectrometer assembly consists of three spectrometers, while the detector assembly incorporates a CMOS detector, an InGaAs detector, and an HgCdTe detector. This invention addresses several limitations of traditional solar reflection full-band hyperspectral detection systems, such as spectrum aliasing and limited detection dynamic range.
Career Highlights
Youlong Ke is affiliated with the Chinese Academy of Sciences, where he continues to advance research in hyperspectral imaging. His work has garnered attention for its innovative approach to solving complex challenges in the field.
Collaborations
Youlong Ke has collaborated with notable colleagues, including Yinnian Liu and Zongcun Zhang. Their combined expertise contributes to the ongoing development of cutting-edge technologies in hyperspectral imaging.
Conclusion
Youlong Ke's contributions to the field of hyperspectral imaging reflect his dedication to innovation and research. His patented technology promises to enhance the capabilities of solar reflection detection systems significantly.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
