Musashino, Japan

Youko Nozawa

This inventor holds 2 USPTO granted patents and 2 EPO patents. Top assignee: Yokogawa Electric Corporation. Active years: 2022-2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Youko Nozawa. Retrieved from https://idiyas.com/inventor/youko-nozawa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2022-2024

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2 patents (USPTO):Explore Patents

Title: Innovations by Youko Nozawa

Introduction

Youko Nozawa is a notable inventor based in Musashino, Japan. He has made significant contributions to the field of measurement devices and liquefied gas production. With a total of two patents to his name, Nozawa's work showcases his expertise and innovative spirit.

Latest Patents

Youko Nozawa's latest patents include an analysis device and a liquefied gas production plant. One of his inventions is a measurement device that features a container for injecting sample gas. This device includes a liquefaction mechanism designed to liquefy the sample gas within the container. Additionally, it has a near-infrared probe that extends from inside to outside the container. A near-infrared measuring instrument is also part of the device, which measures the absorbance spectrum of the liquefied sample gas through the near-infrared probe.

Career Highlights

Nozawa is currently employed at Yokogawa Electric Corporation, where he continues to develop innovative technologies. His work has been instrumental in advancing measurement techniques in various applications.

Collaborations

Some of his coworkers include Ryota Sakai and Hideko Tanaka, who contribute to the collaborative environment at Yokogawa Electric Corporation.

Conclusion

Youko Nozawa's contributions to the field of measurement devices and liquefied gas production highlight his innovative capabilities and dedication to advancing technology. His patents reflect a commitment to improving measurement techniques, making a significant impact in his field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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