Kakogawa, Japan

Youji Abiko

This inventor holds 1 USPTO granted patent. Top assignee: Kabushiki Kaisha Toshiba. Active years: 2003.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Youji Abiko. Retrieved from https://idiyas.com/inventor/youji-abiko

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2003

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1 patent (USPTO):Explore Patents

Title: Youji Abiko: Innovator in Rolling Mill Technology

Introduction

Youji Abiko is a notable inventor based in Kakogawa, Japan. He has made significant contributions to the field of rolling mill technology, particularly with his innovative patent that addresses strip thickness control.

Latest Patents

Abiko holds a patent for a "Strip thickness control apparatus for rolling mill." This apparatus includes several key components such as a strip thickness gauge, a moving distance calculating module, and a rolling roll angle-of-rotation calculating module. The invention aims to enhance the precision of strip thickness during the rolling process, ensuring that the final product meets the desired specifications.

Career Highlights

Youji Abiko is associated with Kabushiki Kaisha Toshiba, a leading company in technology and innovation. His work at Toshiba has allowed him to focus on developing advanced solutions for manufacturing processes, particularly in the metalworking industry.

Collaborations

Abiko has collaborated with talented coworkers such as Takumi Sato and Kunio Sekiguchi. Their combined expertise has contributed to the successful development of innovative technologies in their field.

Conclusion

Youji Abiko's contributions to rolling mill technology exemplify the importance of innovation in manufacturing. His patent for a strip thickness control apparatus showcases his commitment to improving industrial processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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