Beijing, China

Youbao Cao

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Ge Precision Healthcare LLC. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Youbao Cao. Retrieved from https://idiyas.com/inventor/youbao-cao

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Youbao Cao and His Medical Imaging Patent

Introduction

Youbao Cao is an inventor associated with Beijing, China, and Ge Precision Healthcare LLC. His patent work includes an invention focused on positioning a detector in medical imaging equipment.

Latest Patents

Cao is credited with 1 patent: “Examination Table and X-ray Imaging System.” The patent describes an examination table with a table panel assembly and a detector assembly that can move a detector relative to the table. A position-indicating apparatus uses a light-emitting unit attached to the detector assembly and a light-transmitting plate in a non-imaging area of the table. Light passing through the plate indicates the detector’s current position, helping users identify its location without placing the indicator in the imaging region.

Career Highlights

Cao’s listed patent connects his work with medical imaging technology at Ge Precision Healthcare LLC. The invention addresses detector-position visibility as part of an examination table and X-ray imaging system.

Collaborations

Cao’s listed coworkers include Fusheng Li and Yuqing Li. The available information identifies them as colleagues but does not specify their roles in the patent.

Conclusion

Youbao Cao’s patent describes a practical detector-position indicator designed for an examination table and X-ray imaging system, reflecting his contribution to medical imaging technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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