Suwon, South Korea

You Jin Jeong

This inventor holds 15 USPTO granted patents and 22 published patent applications. Top assignees: Samsung Electro-Mechanics, Samsung Electro-Mechanics Co., Ltd.. Active years: 2024-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: You Jin Jeong. Retrieved from https://idiyas.com/inventor/you-jin-jeong

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 15 

% Patents Active = 40.0

Average Co-Inventor Count = 3.1

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2024-2026

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15 patents (USPTO):Explore Patents

Title: You Jin Jeong: Innovator in Imaging Lens Systems

Introduction

You Jin Jeong is a prominent inventor based in Suwon-si, South Korea. He has made significant contributions to the field of imaging lens systems, holding a total of 15 patents. His work is characterized by innovative designs that enhance optical performance.

Latest Patents

Among his latest patents, You Jin Jeong has developed an imaging lens system that includes a lens group with multiple lenses and an optical path folding member positioned on the image side of the lens group. This system is defined by the relationship −1.2

Career Highlights

You Jin Jeong is currently employed at Samsung Electro-Mechanics Co., Ltd., where he continues to push the boundaries of optical technology. His work has not only advanced the company's product offerings but has also contributed to the broader field of imaging technology.

Collaborations

He collaborates with talented colleagues, including Jae Hyuk Huh and So Mi Yang, who share his passion for innovation in optical systems.

Conclusion

You Jin Jeong's contributions to imaging lens systems exemplify his dedication to innovation and excellence in optical technology. His patents reflect a deep understanding of the complexities involved in lens design, making him a valuable asset in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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