Tokyo, Japan

Yosuke Terada

This inventor holds 1 USPTO granted patent. Top assignee: Dai Nippon Printing Co., Ltd.. Active years: 1999.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yosuke Terada. Retrieved from https://idiyas.com/inventor/yosuke-terada-r46x7hbv

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 46(Granted Patents)


Company Filing History:


Years Active: 1999

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Yosuke Terada: Innovator in Optical Technology

Introduction

Yosuke Terada is a prominent inventor based in Tokyo, Japan. He is known for his contributions to the field of optical technology, particularly through his innovative patents. His work has significantly impacted the industry, showcasing his expertise and creativity.

Latest Patents

Yosuke Terada holds a patent for an optical card with a built-in IC module. This invention represents a significant advancement in the integration of optical technology and electronic components, enhancing the functionality and efficiency of optical cards.

Career Highlights

Yosuke Terada is currently employed at Dai Nippon Printing Co., Ltd. His role at this esteemed company allows him to work on cutting-edge technologies and contribute to the development of innovative products in the printing and optical sectors.

Collaborations

Throughout his career, Yosuke has collaborated with notable colleagues, including Yoshihiro Azuma and Seiichi Nishikawa. These partnerships have fostered a creative environment that encourages the exchange of ideas and the development of groundbreaking technologies.

Conclusion

Yosuke Terada is a distinguished inventor whose work in optical technology continues to influence the industry. His patent for an optical card with a built-in IC module exemplifies his innovative spirit and dedication to advancing technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…