Hadano, Japan

Yosuke Tashiro

This inventor holds 1 USPTO granted patent. Top assignee: Toyota Jidosha Kabushiki Kaisha. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yosuke Tashiro. Retrieved from https://idiyas.com/inventor/yosuke-tashiro-ugdbo1l8

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Yosuke Tashiro: Inventor of a Lane Departure Intention Estimation Device.

Introduction

Yosuke Tashiro is an inventor based in Hadano, Japan, and is associated with Toyota Jidosha Kabushiki Kaisha. His patent work includes a device designed to estimate whether a driver intends to depart from a lane.

Latest Patents

Tashiro is named on 1 patent, titled “Lane Departure Intention Estimation Device.” The invention estimates that a driver has no lane departure intention when the driver is distracted or not awake. When neither condition applies, a learned machine-learning model predicts the driver’s intention using time-series signals containing vehicle, lane, and target information, together with a signal classifying the driver’s state. The model is trained using corresponding time-series data, classification signals, and labels.

Career Highlights

The available information identifies Tashiro’s work in driver-state assessment and lane-departure intention estimation. His patented device combines driver-state classification with machine-learning-based prediction.

Collaborations

The patent information associates Tashiro with Toyota Jidosha Kabushiki Kaisha. The provided details do not specify additional collaborators.

Conclusion

Yosuke Tashiro’s patent focuses on using driver-state information and machine learning to estimate lane departure intention, contributing to research in vehicle safety technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…