Neyagawa, Japan

Yosuke Furukawa

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Matsushita Electric Industrial Co., Ltd.. Active years: 2002.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yosuke Furukawa. Retrieved from https://idiyas.com/inventor/yosuke-furukawa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 10(Granted Patents)


Company Filing History:


Years Active: 2002

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1 patent (USPTO):Explore Patents

Title: Yosuke Furukawa: Innovator in Memory Control Technology

Introduction

Yosuke Furukawa is a notable inventor based in Neyagawa, Japan. He has made significant contributions to the field of memory control technology. His innovative work has led to the development of a patent that enhances the efficiency of memory management systems.

Latest Patents

Furukawa holds a patent for a "Memory control unit and memory control method and medium containing program for realizing the same." This invention addresses critical aspects of memory control, providing a framework for improved data management and processing.

Career Highlights

Throughout his career, Yosuke Furukawa has worked with prominent companies such as Matsushita Electric Industrial Co., Ltd. and Panasonic Corporation. His experience in these organizations has allowed him to refine his skills and contribute to various technological advancements.

Collaborations

Furukawa has collaborated with esteemed colleagues, including Toshiyuki Ochiai and Yutaka Tanaka. These partnerships have fostered a creative environment that has led to innovative solutions in memory control technology.

Conclusion

Yosuke Furukawa's contributions to memory control technology exemplify his dedication to innovation. His patent and career achievements highlight the impact of his work in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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