Haifa, Israel

Yossi Kam

This inventor holds 1 USPTO granted patent. Top assignee: Koninklijke Philips Corporation N.v.. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yossi Kam. Retrieved from https://idiyas.com/inventor/yossi-kam

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Yossi Kam and Medical Image Change Detection

Introduction

Yossi Kam is an inventor associated with Haifa, Israel, and Koninklijke Philips N.V. His work includes a patent for a method of detecting and characterizing changes between medical images.

Latest Patents

The provided information lists one patent for Yossi Kam: “Change Detection in Medical Images.” The method generates a difference image that represents intensity differences between two medical images. It fits a mixture model to the difference image’s intensity distribution, identifies probability distributions that collectively model that distribution, and uses them to determine intensity ranges. Image data is then labeled according to the range into which its intensity falls. This approach is intended to describe changes in medical images more accurately than known methods.

Career Highlights

Kam’s listed patent reflects work at the intersection of image analysis and medical technology. The technique uses statistical modeling to organize differences between images into meaningful intensity ranges.

Collaborations

The provided information names Shelly Theodora Yehezkely and Tamar Debora Schirman as Kam’s coworkers. It does not specify their roles in the patent or the extent of their collaboration.

Conclusion

Yossi Kam’s listed invention applies mixture modeling and intensity-based labeling to improve the analysis of changes in medical images.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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