Tsuchiura, Japan

Yoshiyuki Nag'No


Average Co-Inventor Count = 14.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2008

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1 patent (USPTO):Explore Patents

Title: Innovations by Yoshiyuki Nag'No in Probe Technology

Introduction

Yoshiyuki Nag'No is a prominent inventor based in Tsuchiura, Japan. He is recognized for his innovative work in the field of probe technology, contributing to advancements in scanning probe microscopy through a unique patent. His passion for enhancing the functionality and efficiency of probes has set him apart in the scientific community.

Latest Patents

Yoshiyuki Nag'No holds a patent for a "Probe manufacturing method, probe, and scanning probe microscope." This innovative approach involves attaching a carbon nanotube to a mounting base end, which effectively eliminates the adverse effects of carbon contamination films. By enhancing the bonding strength and conductivity of the probe, this method improves the overall performance of scanning probe microscopy. Notably, the entire circumference of the nanotube and the base is coated with a film, rather than just one side, maximizing the effectiveness of the bond. The processes of mounting and observation are meticulously conducted under a microscope, ensuring precision during creation. Additionally, any carbon contamination film formed during electron microscopy is removed prior to bonding, further optimizing the probe's functionality.

Career Highlights

Yoshiyuki Nag'No is associated with Hitachi Kenki Fine Tech Co., Ltd., where he has contributed significantly to the company's advancements in technology. His dedication to innovation has established him as an influential figure within the organization. His expertise and creative thinking have propelled significant developments in microscopic technologies, reinforcing Hitachi Kenki's reputation in the industry.

Collaborations

Throughout his career, Yoshiyuki has collaborated with esteemed coworkers such as Takafumi Morimoto and Tooru Shinaki. Together, they have worked on various projects aimed at enhancing probe technology, showcasing the power of teamwork in driving innovative solutions in the scientific field.

Conclusion

Yoshiyuki Nag'No's contributions to probe technology exemplify the innovative spirit of modern inventors. His patented methods for manufacturing probes not only enhance their performance but also pave the way for further advancements in scanning probe microscopy. Through collaborations and a commitment to research, he continues to inspire and shape the future of technology in his field.

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