Fukui, Japan

Yoshitsugu Kobayashi

This inventor holds 1 USPTO granted patent. Top assignee: Nippon Mayer Co., Ltd.. Active years: 1997.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yoshitsugu Kobayashi. Retrieved from https://idiyas.com/inventor/yoshitsugu-kobayashi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 1997

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1 patent (USPTO):Explore Patents

Title: The Innovations of Yoshitsugu Kobayashi

Introduction

Yoshitsugu Kobayashi is a notable inventor based in Fukui, Japan. He has made significant contributions to the field of warp knitting technology. His innovative approach has led to the development of a unique patent that enhances the efficiency of knitting machines.

Latest Patents

Kobayashi holds a patent for a "Patterning method and device in warp knitting machine." This invention showcases his expertise in textile engineering and his commitment to advancing knitting technology. He has 1 patent to his name, reflecting his innovative spirit and technical proficiency.

Career Highlights

Kobayashi is currently employed at Nippon Mayer Co., Ltd., a company known for its advancements in textile machinery. His work at this organization has allowed him to apply his inventive ideas in a practical setting, contributing to the company's reputation in the industry.

Collaborations

Throughout his career, Kobayashi has collaborated with talented individuals such as Norimasa Nosaka and Yoshinori Otobe. These partnerships have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Yoshitsugu Kobayashi's contributions to the field of warp knitting technology exemplify the impact of innovation in the textile industry. His patent and collaborations highlight his dedication to advancing this field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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