Takatsuki, Japan

Yoshitaka Hanaki

This inventor holds 1 USPTO granted patent. Top assignee: Matsushita Electric Industrial Co., Ltd.. Active years: 2003.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yoshitaka Hanaki. Retrieved from https://idiyas.com/inventor/yoshitaka-hanaki

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2003

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1 patent (USPTO):Explore Patents

Title: The Innovations of Yoshitaka Hanaki

Introduction

Yoshitaka Hanaki is a notable inventor based in Takatsuki, Japan. He has made significant contributions to the field of error correction technology. His work focuses on enhancing the efficiency and miniaturization of electronic devices.

Latest Patents

Hanaki holds a patent for a "Chien's searching apparatus." This invention aims to speed up operations used in error correction, thereby reducing power dissipation. The apparatus features multiple arithmetic units that share an error-position polynomial calculating unit and an error-numeral polynomial calculating unit. It also includes selectors and registers to perform calculations on multiple orders within the same cycle. Additionally, a shared divider unit is utilized, which stops when no error is detected.

Career Highlights

Yoshitaka Hanaki is associated with Matsushita Electric Industrial Co., Ltd., a leading company in the electronics industry. His work there has contributed to advancements in error correction technologies, showcasing his expertise and innovative spirit.

Collaborations

Hanaki has collaborated with Masanori Hirofuji, further enhancing the development of his inventions and contributing to the field of technology.

Conclusion

Yoshitaka Hanaki's contributions to error correction technology through his innovative inventions highlight his role as a significant figure in the field. His work continues to influence advancements in electronic devices and their efficiency.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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