Location History:
- Chiba, JP (2016 - 2021)
- Tokyo, JP (2022 - 2024)
Company Filing History:
Years Active: 2016-2025
Title: Yoshiomi Shiina: Innovator in Overheat Protection and Switching Regulators
Introduction
Yoshiomi Shiina is a prominent inventor based in Chiba, Japan. He has made significant contributions to the field of electronics, particularly in the development of overheat protection circuits and switching regulators. With a total of 10 patents to his name, Shiina's work has had a substantial impact on the industry.
Latest Patents
One of his latest patents is an overheat protection circuit designed to improve the accuracy of overheat detection. This circuit includes an input terminal, an output terminal, and a first transistor that can switch between ON and OFF states. Additionally, it features a first NPN transistor that operates based on a reference voltage with a temperature characteristic of zero or more. Another notable patent is a switching regulator control circuit and DC/DC converter. This converter is capable of providing reliable overvoltage protection without being affected by external elements connected to the output terminal. It comprises a comparator, an RS-FF circuit, a drive circuit, and an ON-timer circuit, which includes various components to ensure effective operation.
Career Highlights
Throughout his career, Yoshiomi Shiina has worked with notable companies such as Ablic Inc. and Sii Semiconductor Corporation. His experience in these organizations has allowed him to refine his skills and contribute to innovative projects in the electronics sector.
Collaborations
Shiina has collaborated with esteemed colleagues, including Masayuki Uno and Kenji Yoshida. These partnerships have fostered a creative environment that has led to the development of groundbreaking technologies.
Conclusion
Yoshiomi Shiina's contributions to the field of electronics, particularly in overheat protection and switching regulators, highlight his innovative spirit and technical expertise. His patents reflect a commitment to enhancing the reliability and efficiency of electronic devices.