The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 13, 2023
Filed:
Mar. 24, 2021
Applicant:
Ablic Inc., Tokyo, JP;
Inventors:
Yoshiomi Shiina, Tokyo, JP;
Kenji Yoshida, Tokyo, JP;
Assignee:
ABLIC Inc., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01H 85/02 (2006.01); H03K 3/037 (2006.01); G01R 31/74 (2020.01); H03K 19/20 (2006.01);
U.S. Cl.
CPC ...
H01H 85/0241 (2013.01); G01R 31/74 (2020.01); H03K 3/037 (2013.01); H03K 19/20 (2013.01); H01H 2085/0283 (2013.01);
Abstract
Provided is a semiconductor device capable of detecting an abnormal state in which two fuses are both short-circuited or cut. The semiconductor device includes: a trimming circuit having a first fuse and a second fuse connected in series; a current source circuit configured to supply current to the trimming circuit; and a determination circuit configured to determine whether a connection state or disconnect state of the first fuse and the second fuse are abnormal or not based upon signals derived from an output signal of the trimming circuit.