Tokyo, Japan

Yoshio Onda

This inventor holds 1 USPTO granted patent. Top assignee: Honda Engineering Co., Ltd.. Active years: 1993.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yoshio Onda. Retrieved from https://idiyas.com/inventor/yoshio-onda

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 1993

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1 patent (USPTO):Explore Patents

Title: Innovations of Yoshio Onda in Fluid Measurement Technology.

Introduction

Yoshio Onda is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of fluid measurement technology. His innovative approach has led to the development of a unique fluid speed measuring probe.

Latest Patents

Yoshio Onda holds a patent for a fluid speed measuring probe. This invention utilizes a change in the resistance of a sensor made from a small piece of single crystal germanium, which responds to temperature changes. The sensor's peripheral surface is covered with an insulating member made of synthetic resin, and the outer periphery is further covered with a spherical metal that has heat conductivity. This design eliminates the directivity of the sensor, allowing for accurate measurement of fluid speed regardless of the angle between the fluid flow direction and the probe. He has 1 patent to his name.

Career Highlights

Yoshio Onda is associated with Honda Engineering Co., Ltd., where he applies his expertise in engineering and innovation. His work at Honda has allowed him to contribute to advancements in automotive technology and fluid dynamics.

Collaborations

Due to space limitations, the collaborations section will be omitted.

Conclusion

Yoshio Onda's innovative work in fluid measurement technology exemplifies the impact of engineering on practical applications. His contributions continue to influence the field and enhance measurement accuracy in various industries.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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