Company Filing History:
Years Active: 2004
Title: Innovations of Yoshio Fujieda in Semiconductor Technology
Introduction
Yoshio Fujieda is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of semiconductor technology. His work primarily focuses on developing advanced materials that enhance the performance and reliability of semiconductor devices.
Latest Patents
Fujieda holds a patent for an epoxy resin composition and semiconductor device. This innovative epoxy resin composition is designed for encapsulating semiconductors and contains substantially no halogen-based flame-retarding agents or antimony compounds. The composition boasts properties such as moldability, flame retardance, high-temperature storage characteristics, reliability for moisture resistance, and solder cracking resistance. The essential components of this composition include an epoxy resin, a phenolic resin, a curing accelerator, an inorganic filler, and a phosphazene compound. Notably, the total weight of phosphate ion and phosphite ion contained in the phosphazene compound is limited to not more than 500 ppm. Additionally, the composition may optionally include a flame-retarding assistant or an ion scavenger.
Career Highlights
Fujieda is associated with Sumitomo Bakelite Company Limited, where he has been instrumental in advancing the company's research and development efforts in semiconductor materials. His innovative approach has led to the creation of high-performance materials that meet the stringent requirements of modern electronics.
Collaborations
Fujieda has worked alongside talented colleagues such as Takafumi Sumiyoshi and Ayako Mizushima. Their collaborative efforts have contributed to the successful development of cutting-edge technologies in the semiconductor industry.
Conclusion
Yoshio Fujieda's contributions to semiconductor technology through his innovative epoxy resin composition highlight his role as a leading inventor in the field. His work continues to influence advancements in electronic materials and device reliability.