Location History:
- Hitachinaka, JP (2009 - 2014)
- Tokyo, JP (2015)
Company Filing History:
Years Active: 2009-2015
Title: Innovations of Yoshio Bamba
Introduction
Yoshio Bamba is a notable inventor based in Hitachinaka, Japan. He has made significant contributions to the field of optical inspection technology, holding a total of 4 patents. His work focuses on enhancing the accuracy and efficiency of inspection systems used in various applications.
Latest Patents
Bamba's latest patents include an optical type inspection apparatus, an inspection system, and a wafer for coordinates management. The optical inspection device features a line sensor with arranged channels and a moving mechanism that allows a wafer to be positioned relative to the sensor. It includes a stage position detection system that identifies pseudo-defects in images, transforming these into pseudo-defect die coordinates. Additionally, it computes differences from design coordinates and acquires a characteristic pattern of coordinate errors. Another patent involves a foreign matter inspection apparatus that maintains stable detection sensitivity. This system utilizes a laser beam directed at a sample, with adjustments made to correct the beam's inclination and focus based on captured images.
Career Highlights
Yoshio Bamba is associated with Hitachi High-Technologies Corporation, where he has been instrumental in developing advanced inspection technologies. His innovative approaches have significantly impacted the industry, leading to improved inspection processes.
Collaborations
Bamba has collaborated with notable colleagues, including Masayuki Ochi and Shigehisa Nozawa. Their combined expertise has contributed to the success of various projects within the company.
Conclusion
Yoshio Bamba's contributions to optical inspection technology exemplify the importance of innovation in enhancing industrial processes. His patents reflect a commitment to improving accuracy and efficiency in inspection systems.