Hirakata, Japan

Yoshimitsu Hiroshima

This inventor holds 2 USPTO granted patents. Top assignee: Matsushita Electronics Corporation. Active years: 1978-1980.


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 2

Forward Citations = 53(Granted Patents)


Location History:

  • Hirakata, JA (1978)
  • Hirakata, JP (1980)

Company Filing History:


Years Active: 1978-1980

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2 patents (USPTO):Explore Patents

Title: Innovations of Yoshimitsu Hiroshima

Introduction

Yoshimitsu Hiroshima is a notable inventor based in Hirakata, Japan. He has made significant contributions to the field of solid-state imaging technology. With a total of 2 patents, his work has advanced the capabilities of image sensing devices.

Latest Patents

Hiroshima's latest patents include a solid-state image sensing device and a solid-state imaging device. The solid-state image sensing device features a matrix of photoelectric diodes on a monolithic substrate. It incorporates transferring switching means and noise eliminating MOS switches for each vertical column, enhancing the scanning speed and eliminating various noise types. The solid-state imaging device consists of multiple picture elements, each comprising a MOSFET and a photodiode. This design improves the scanning speed and eliminates photo spurious signals and noise spikes.

Career Highlights

Yoshimitsu Hiroshima is currently employed at Matsushita Electronics Corporation, where he continues to innovate in the field of imaging technology. His work has been instrumental in developing devices that enhance image quality and performance.

Collaborations

Hiroshima has collaborated with notable coworkers such as Hirokuni Nakatani and Susumu Hashimoto. Their combined expertise has contributed to the success of various projects within the company.

Conclusion

Yoshimitsu Hiroshima's contributions to solid-state imaging technology have made a significant impact in the field. His innovative patents and collaborations reflect his dedication to advancing technology.

Profile summary based on public USPTO records.
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