Yokohama, Japan

Yoshiki Takabatake

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Mitsumi Electric, Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yoshiki Takabatake. Retrieved from https://idiyas.com/inventor/yoshiki-takabatake

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Yoshiki Takabatake: Patent Work in Power-Supply Semiconductor Technology.

Introduction

Yoshiki Takabatake is an inventor associated with Yokohama, Japan, and Mitsumi Electric, Ltd. His documented patent work concerns current detection and power-supply semiconductor circuitry.

Latest Patents

Takabatake is associated with 1 patent: “Current Detection Circuit and Power Supply Semiconductor Integrated Circuit.” The patent describes a current-detection circuit that converts current into voltage and compares the resulting voltage with a reference or another voltage derived from the current being detected. Its hysteresis circuit uses a current source and a comparator-controlled switch to increase or decrease current in the converter, changing the relevant voltage and adding hysteresis to the comparator’s operation.

Career Highlights

The available information connects Takabatake’s patent activity with Mitsumi Electric, Ltd. His documented invention addresses circuit behavior relevant to current detection in power-supply semiconductor integrated circuits.

Collaborations

Yuichi Ueda is identified as Takabatake’s coworker. The supplied information does not specify their roles or describe a particular joint project.

Conclusion

Yoshiki Takabatake’s documented patent contribution focuses on a hysteresis-based current-detection circuit for power-supply semiconductor applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…