Fujinomiya, Japan

Yoshikazu Sano


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 10(Granted Patents)


Company Filing History:


Years Active: 1990

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1 patent (USPTO):Explore Patents

Title: Innovations by Yoshikazu Sano

Introduction

Yoshikazu Sano is a notable inventor based in Fujinomiya, Japan. He has made significant contributions to the field of temperature measurement technology. His innovative approach has led to the development of a unique method and apparatus for automatically testing temperature measuring devices.

Latest Patents

Yoshikazu Sano holds a patent for a "Method and apparatus for automatically testing temperature measuring." This invention involves a systematic approach to testing various functions of a temperature measuring device. The method includes subjecting the temperature measuring portion to predetermined temperatures and reading the output information optically or acoustically. The process ensures that the device's functions are tested sequentially based on the types of functions being evaluated. The read information is then compared with predetermined data to determine the success or failure of each function. This comprehensive testing includes checking the thermal equilibrium temperature measurement function, the initial display of the device, and the automatic measurement start function.

Career Highlights

Yoshikazu Sano is associated with Terumo Kabushiki Kaisha, a prominent company in the medical technology sector. His work has been instrumental in enhancing the reliability and accuracy of temperature measuring devices. His innovative contributions have positioned him as a key figure in the field.

Collaborations

Yoshikazu has collaborated with notable colleagues, including Susumu Kobayashi and Kiyoshi Endo. Their combined expertise has further advanced the development of innovative technologies in temperature measurement.

Conclusion

Yoshikazu Sano's contributions to the field of temperature measurement technology exemplify the impact of innovation in enhancing device functionality and reliability. His work continues to influence advancements in this critical area.

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