The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 06, 1990
Filed:
Apr. 04, 1988
Terumo Kabushiki Kaisha, Tokyo, JP;
Abstract
In a method and apparatus for testing a number of functions of a temperature measuring device, a temperature measuring portion is subjected to a predetermined temperature, and information outputted by the device is read optically or acoustically. The application of various temperatures and the reading of the outputted information are controlled sequentially in dependence upon the types of functions to be tested, and the read information is compared with predetermined information to determine whether each function passes or fails the test. A thermal equilibrium temperature measurement function of the device is tested by heating the temperature measuring portion to thermal equilibrium. Power is then reintroduced to the device and the initial display of the device is tested to determine if all segments of the display light. Next, the device is cooled to a predetermined temperature, reheating is started and information displayed upon elapse of a first predetermined time period is read to check the automatic measurement start function of the device. Information displayed upon elapse of a second predetermined time period is read to check a predicted equilibrium temperature measurement function. An acoustic warning alarm function is tested by subjecting the device to a high temperature.