Nagaokakyo, Japan

Yoshihito Okutomi

This inventor holds 3 USPTO granted patents and 2 published patent applications. Top assignees: Murata Manufacturing Co., Ltd., Murata Manufacturing Co., Ltd.. Active years: 2018-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yoshihito Okutomi. Retrieved from https://idiyas.com/inventor/yoshihito-okutomi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 3 

% Patents Active = 66.7

Average Co-Inventor Count = 2.4

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 2018-2026

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3 patents (USPTO):Explore Patents

Title: Yoshihito Okutomi: Innovator in Sensor Technology

Introduction

Yoshihito Okutomi is an inventor based in Nagaokakyo-shi, Japan. He is known for his work in sensor technology, focusing on innovative designs that enhance the functionality of electronic devices. Although he currently holds no granted patents, his contributions to the field are noteworthy.

Latest Patent Applications

Yoshihito Okutomi has filed several patent applications that showcase his inventive ideas. One of his latest applications is for a sensor and electronic device that includes a holding member with a rectangular shape, designed to detect deformation. This sensor outputs a signal when the holding member is deformed, featuring multiple fixing portions that are strategically placed. Another application is for a deformation detection sensor that utilizes a bendable flexible substrate. This sensor includes two piezoelectric films, each with different thicknesses, allowing for effective detection of bending in the substrate.

Conclusion

Yoshihito Okutomi's innovative approach to sensor technology highlights his potential as an inventor in the field. His latest patent applications reflect a commitment to advancing electronic device functionality through creative solutions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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